Services
Chemical and physical characterization
Are you a company or an institute looking for support in chemical and physical characterisation in the field of hydrogen, batteries or advanced materias?
Check our services and contact us at [email protected]!
Analysis and Quantification of gases and volatile hydrocarbons
Our laboratories are equipped with instruments to identify and quantify components (such as permanent gases, ammonia, volatile hydrocarbons, etc.) in gas mixtures:
- 2 Mass Spectrometer for the Residual Gas Analysis (HPR-20, Hiden)
- 1 Gas Chromatographer equipped with FID and TCD detectors (TGA 6000, VICI DBS)
Analysis and Quantification of heavy metals
Our laboratories are equipped with an Inductively Coupled Plasma Mass Spectrometer (ICP-MS, 7850, Agilent) for metal analysis at trace level – parts per billion (ppb) – in aqueous solutions (e.g. catalyst dissolution in process water)
Morphological and Compositional analysis of materials
Our laboratories are equipped with a Scanning Electron Microscope (SEM, JSM-IT510LV, JEOL) with EDX accessory (Oxford) for the morphological and compositional analysis of solid samples (films and/or powders) at the micro-to-nanometer scale.
Analysis of Surface Area of solid materials
Our laboratories are equipped with a BET Surface Area Analyzer (BELSORP MINI-X, Microtrac) for determining the specific surface area and porosity of solid materials (powders, catalysts, porous materials) by measuring the physical adsorption of gas molecules (typically nitrogen) at cryogenic temperatures.
Structural and Phase Characterization
Our laboratories are equipped with advanced X-Ray Diffraction systems for crystal structure analysis, phase identification, and crystallinity assessment of materials:
- X-Ray Diffractometer (XRD) for bulk materials, powders, and catalysts
- Grazing Incidence X-Ray Diffractometer (GIXRD) for thin film characterization and surface-sensitive structural analysis
Surface Chemistry and Composition Analysis
Our laboratories feature an X-ray Photoelectron Spectroscope (XPS) for quantitative analysis of surface elemental composition, chemical states, and oxidation states of materials. This technique provides critical insights into surface modifications, contamination, and thin film properties at the nanometer scale.
Infrared spectroscopy
Our laboratories feature a Fourier-Transform Infrared) spectrophotometer (FTIR) equipped with Attenuated Total Reflectance (ATR) and Transmission module for analysis on liquid, powders and solid samples.
Thermal analysis
Our laboratories are equipped with a thermo-gravimetric analysis (TGA) instrument for materials characterization from room temperature up to 1000 °C under both nitrogen and air atmosphere.
UV-Vis Spectroscopy
Our laboratory is equipped with a UV‑Vis‑NIR spectrophotometer (190–2700 nm) with double‑beam optics, single Czerny–Turner monochromator, two gratings (1200 and 300 lines/mm), and dual light sources (Deuterium Arc and Tungsten‑Halogen lamps).
Electrochemical characterisation
Our laboratories are equipped with several potentiostats capable of performing cyclic voltammetry (CV), linear sweep voltammetry (LSV), ionic conductivity measurements and electrochemical impedance spectroscopy (EIS) tests on Li–ion and next-generation batteries on with two/three electrode cells and on redox-flow electrolytes with three electrodes setups and rotating disk electrode (RDE).
Density and Viscosity
Our laboratory is equipped with a high precision density meter employing a Pulsed Excitation Method and a temperature–controlled viscosity meter with rotating capillary technology.